Test Case Generation Algorithm Based on MC/DC with Coupling Conditions
CSTR:
Author:
Affiliation:

Clc Number:

Fund Project:

  • Article
  • |
  • Figures
  • |
  • Metrics
  • |
  • Reference
  • |
  • Related
  • |
  • Cited by
  • |
  • Materials
  • |
  • Comments
    Abstract:

    MC/DC is a coverage criterion for the verification of avionics software of Level A, which can massively lower down the number of test cases. This paper focuses on the research of the logical expression with coupling conditions, and studies how to obtain the test case set as small as possible. It proposes two solutions which can be used respectively to solve the problems under the conditions of zero-coupling/weak-coupling and strong-coupling, and related examples are showed. The result shows that flexible usage of the two algorithms can solve the problems of rapid generation of MC/DC test case set for general logic expression.

    Reference
    Related
    Cited by
Get Citation

谢祥南,魏延栋.耦合条件的MC/DC测试用例集生成算法.计算机系统应用,2017,26(6):164-169

Copy
Share
Article Metrics
  • Abstract:
  • PDF:
  • HTML:
  • Cited by:
History
  • Received:September 29,2016
  • Revised:November 03,2016
  • Adopted:
  • Online: June 08,2017
  • Published:
Article QR Code
You are the firstVisitors
Copyright: Institute of Software, Chinese Academy of Sciences Beijing ICP No. 05046678-3
Address:4# South Fourth Street, Zhongguancun,Haidian, Beijing,Postal Code:100190
Phone:010-62661041 Fax: Email:csa (a) iscas.ac.cn
Technical Support:Beijing Qinyun Technology Development Co., Ltd.

Beijing Public Network Security No. 11040202500063