Auto Detection of Invalid Block of Flash Memory Based on STM32
DOI:
CSTR:
Author:
Affiliation:

Clc Number:

Fund Project:

  • Article
  • |
  • Figures
  • |
  • Metrics
  • |
  • Reference
  • |
  • Related
  • |
  • Cited by
  • |
  • Materials
  • |
  • Comments
    Abstract:

    According to Nand Flash memory bad block problem, this paper proposed a automatic check scheme to deal with bad block based on STM32. Without increasing the external device, through its internal flexible static memory controller, sends the corresponding data, address, control signals, to rapid access Flash memory. Its part circuit schematic diagram and C language program code was introduced. The design has been successfully realized the function of automatic checking the invalid block finally, and has the advantages of simple operation, fast detection speed, high accuracy rate, and can read the ID number of Flash to get the performance of the memory. And the design also can write and read 2GB data.

    Reference
    Related
    Cited by
Get Citation

张亚辉,马胜前.基于STM32的Flash存储器坏块自动检测.计算机系统应用,2013,22(6):209-211,215

Copy
Share
Article Metrics
  • Abstract:
  • PDF:
  • HTML:
  • Cited by:
History
  • Received:November 26,2012
  • Revised:January 16,2013
  • Adopted:
  • Online: July 25,2013
  • Published:
Article QR Code
You are the firstVisitors
Copyright: Institute of Software, Chinese Academy of Sciences Beijing ICP No. 05046678-3
Address:4# South Fourth Street, Zhongguancun,Haidian, Beijing,Postal Code:100190
Phone:010-62661041 Fax: Email:csa (a) iscas.ac.cn
Technical Support:Beijing Qinyun Technology Development Co., Ltd.

Beijing Public Network Security No. 11040202500063