Fault Detection System for Electronic Equipment Based on LabVIEW
DOI:
CSTR:
Author:
Affiliation:

Clc Number:

Fund Project:

  • Article
  • |
  • Figures
  • |
  • Metrics
  • |
  • Reference
  • |
  • Related
  • |
  • Cited by
  • |
  • Materials
  • |
  • Comments
    Abstract:

    Based on current test system theory and the virtual instrument technology research in this paper, establishing a detecting system as the PXI core based on the comprehensive testing system for LabVIEW8.5. Based on LabVIEW for the software platform in this system, with graphical program language designed for electronic equipment system detecting modules and the source program flowchart. This detecting system can reduce maintenance cycle effectively, reduce maintenance costs and improve reliability, system maintenance level of electronic equipment to achieve digital, modularization and intelligent .

    Reference
    Related
    Cited by
Get Citation

马亮,李云涛,杨雪峰. LabVIEW的电子设备故障检测系统.计算机系统应用,2012,21(8):152-155

Copy
Share
Article Metrics
  • Abstract:
  • PDF:
  • HTML:
  • Cited by:
History
  • Received:February 16,2012
  • Revised:March 09,2012
  • Adopted:
  • Online:
  • Published:
Article QR Code
You are the firstVisitors
Copyright: Institute of Software, Chinese Academy of Sciences Beijing ICP No. 05046678-3
Address:4# South Fourth Street, Zhongguancun,Haidian, Beijing,Postal Code:100190
Phone:010-62661041 Fax: Email:csa (a) iscas.ac.cn
Technical Support:Beijing Qinyun Technology Development Co., Ltd.

Beijing Public Network Security No. 11040202500063