Accurate Measurement for Pin Parameters Based on Subpixel Edge Localization
DOI:
CSTR:
Author:
Affiliation:

Clc Number:

Fund Project:

  • Article
  • |
  • Figures
  • |
  • Metrics
  • |
  • Reference
  • |
  • Related
  • |
  • Cited by
  • |
  • Materials
  • |
  • Comments
    Abstract:

    In order to improve detection efficiency and accuracy of pin parameters, a non-contact measurement method of pin based on subpixel edge localization is presented in this paper. Firstly, LOG operator is used to seek approximate localization on pixel level, which can keep the intact edge information of image while restraining the noise. Then, improved Zernike moment is used to abstract subpixel edge localization. Finally, the exact edge of pin is gained from the discrete subpixel points using the least square fitting method. The experimental results show that this method can locate the edge with high accuracy and good stability, and satisfy the request of the on-line detection of pin.

    Reference
    Related
    Cited by
Get Citation

顾裕丰,刘国栋.基于亚像素边缘定位的排针参数精密测量.计算机系统应用,2011,20(11):189-192

Copy
Share
Article Metrics
  • Abstract:
  • PDF:
  • HTML:
  • Cited by:
History
  • Received:March 27,2011
  • Revised:April 23,2011
  • Adopted:
  • Online:
  • Published:
Article QR Code
You are the firstVisitors
Copyright: Institute of Software, Chinese Academy of Sciences Beijing ICP No. 05046678-3
Address:4# South Fourth Street, Zhongguancun,Haidian, Beijing,Postal Code:100190
Phone:010-62661041 Fax: Email:csa (a) iscas.ac.cn
Technical Support:Beijing Qinyun Technology Development Co., Ltd.

Beijing Public Network Security No. 11040202500063